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| 74F841 10-Bit Transparent Latch March 1988 Revised August 1999 74F841 10-Bit Transparent Latch General Description The 74F841 bus interface latch is designed to eliminate the extra packages required to buffer existing latches and provide extra data width for wider address/data paths or buses carrying parity. The 74F841 is a 10-bit transparent latch, a 10-bit version of the 74F373. Features s 3-STATE output Ordering Code: Order Number 74F841SC 74F841SPC Package Number M24B N24C Package Description 24-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide 24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-100, 0.300 Wide Devices also available in Tape and Reel. Specify by appending the suffix letter "X" to the ordering code. Logic Symbols Connection Diagram IEEE/IEC (c) 1999 Fairchild Semiconductor Corporation DS009599 www.fairchildsemi.com 74F841 Unit Loading/Fan Out Pin Names D0-D9 O0-O9 OE LE Description Data Inputs 3-STATE Outputs Output Enable Input Latch Enable U.L. HIGH/LOW 1.0/1.0 150/40 1.0/1.0 1.0/1.0 Input IIH/IIL Output IOH/IOL 20 A/-0.6 mA -3 mA/24 mA 20 A/-0.6 mA 20 A/-0.6 mA Functional Description The 74F841 device consists of ten D-type latches with 3STATE outputs. The flip-flops appear transparent to the data when Latch Enable (LE) is HIGH. This allows asynchronous operation, as the output transition follows the data in transition. On the LE HIGH-to-LOW transition, the data that meets the setup and hold time is latched. Data appears on the bus when the Output Enable (OE) is LOW. When OE is HIGH the bus output is in the high impedance state. Function Table Inputs OE X H H H L L L L L L H H LE X H H L H H L X X X L L D X L H X L H X X X X X X Internal Q X L H NC L H NC H L H L H Output Function O Z Z Z Z L H NC H L H Z Z High Z High Z High Z Latched Transparent Transparent Latched Preset Clear Preset Latched Latched H = HIGH Voltage Level L = LOW Voltage Level X = Immaterial Z = HIGH Impedance NC = No Change Logic Diagram Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays. www.fairchildsemi.com 2 74F841 Absolute Maximum Ratings(Note 1) Storage Temperature Ambient Temperature under Bias Junction Temperature under Bias VCC Pin Potential to Ground Pin Input Voltage (Note 2) Input Current (Note 2) Voltage Applied to Output in HIGH State (with VCC = 0V) Standard Output 3-STATE Output Current Applied to Output in LOW State (Max) twice the rated IOL (mA) -0.5V to VCC -0.5V to +5.5V -65C to +150C -55C to +125C -55C to +150C -0.5V to +7.0V -0.5V to +7.0V -30 mA to +5.0 mA Recommended Operating Conditions Free Air Ambient Temperature Supply Voltage 0C to +70C +4.5V to +5.5V Note 1: Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 2: Either voltage limit or current limit is sufficient to protect inputs. DC Electrical Characteristics Symbol VIH VIL VCD VOH Parameter Input HIGH Voltage Input LOW Voltage Input Clamp Diode Voltage Output HIGH Voltage 10% VCC 10% VCC 5% VCC 5% VCC VOL IIH IBVI ICEX VID IOD IIL IOZH IOZL IOS IZZ ICCZ Output LOW Voltage Input HIGH Current Input HIGH Current Breakdown Test Output HIGH Leakage Current Input Leakage Test Output Leakage Circuit Current Input LOW Current Output Leakage Current Output Leakage Current Output Short-Circuit Current Bus Drainage Test Power Supply Current 69 -60 4.75 3.75 -0.6 50 -50 -150 500 92 10% VCC 2.5 2.4 2.7 2.7 0.5 5.0 7.0 50 V A A A V A mA A A mA A mA Min Max Max Max 0.0 0.0 Max Max Max Max 0.0V Max V Min Min 2.0 0.8 -1.2 Typ Max Units V V V Min VCC Conditions Recognized as a HIGH Signal Recognized as a LOW Signal IIN = -18 mA IOH = -1 mA IOH = -3 mA IOH = -1 mA IOH = -3 mA IOL = 24 mA VIN = 2.7V VIN = 7.0V VOUT = VCC IID = 1.9 A All Other Pins Grounded VIOD = 150 mV All Other Pins Grounded VIN = 0.5V VOUT = 2.7V VOUT = 0.5V VOUT = 0V VOUT = 5.25V VO = HIGH Z 3 www.fairchildsemi.com 74F841 AC Electrical Characteristics TA = +25C Symbol Parameter Min tPLH tPHL tPLH tPHL tPZH tPZL tPHZ tPLZ Propagation Delay Dn to On Propagation Delay LE to On Output Enable Time OE to On Output Disable Time OE to On 2.5 1.5 5.0 2.0 2.5 2.5 1.0 1.0 VCC = +5.0V CL = 50 pF Typ Max 8.0 6.5 12.0 7.5 8.5 9.0 6.5 6.5 TA = 0C to +70C VCC = +5.0V CL = 50 pF Min 2.0 1.5 4.5 2.0 2.0 2.0 1.0 1.0 Max 9.0 7.0 13.5 8.0 9.5 10.0 7.5 7.5 ns ns ns Units AC Operating Requirements TA = +25C Symbol Parameter VCC = +5.0V Min tS(H) tS(L) tH(H) tH(L) tW(H) Setup Time, HIGH or LOW Dn to LE Hold Time, HIGH or LOW Dn to LE LE Pulse Width, HIGH 2.0 2.0 2.5 3.0 4.0 Max TA = 0C to +70C VCC = +5.0V Min 2.5 2.5 3.0 3.5 4.0 ns ns Max Units www.fairchildsemi.com 4 74F841 Physical Dimensions inches (millimeters) unless otherwise noted 24-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide Package Number M24B 5 www.fairchildsemi.com 74F841 10-Bit Transparent Latch Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-100, 0.300 Wide Package Number N24C Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications. LIFE SUPPORT POLICY FAIRCHILD'S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. www.fairchildsemi.com 6 2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. www.fairchildsemi.com |
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